ASML 4022 435 2439 40224352439

全局快门CMOS传感器(索尼IMX519系列),量子效率≥90%(405nm波长)。

自主研发FPGA芯片(ASML-FPGA 2025),支持实时图像降噪与边缘增强。

环境适应性:

真空封装设计,内部气压<1e-5 mbar,减少空气折射率波动影响。

钛合金框架与碳纤维复合散热片,热膨胀系数(CTE)匹配光刻机基座(0.8ppm/℃)。

2.性能突破

动态响应能力:

支持3000线/秒的晶圆扫描速度,图像采集延迟<1ms。

抗干扰能力:

屏蔽层采用铜-银纳米复合材料,电磁屏蔽效能达90dB(1MHz~1GHz)。

能效优化:

动态功耗管理技术,待机功耗≤2W,运行功耗≤15W。

技术规格:ASML 4022 435 2439 40224352439

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描述

产品简要说明

ASML 4022 435 2439 40224352439是ASML专为光刻机设计的高精度光学检测模块,核心特性包括:

纳米级分辨率:采用CMOS全局快门传感器,单像素尺寸≤0.5μm,分辨率≥16K(15360×8640)。

实时动态校准:支持激光干涉仪联动校准,定位误差≤0.05μm。

洁净室级防护:通过Class 1洁净室认证,气密性等级IP69K,抗静电等级ESD 10kV。

产品详细说明

1.技术架构与核心功能

光学成像系统:

镜头组采用自由曲面透镜与偏振分光技术,消除光刻机激光的散射干扰。

集成可调谐激光光源(波长405nm/450nm/633nm),支持多光谱成像模式。

传感器与处理单元:

全局快门CMOS传感器(索尼IMX519系列),量子效率≥90%(405nm波长)。

自主研发FPGA芯片(ASML-FPGA 2025),支持实时图像降噪与边缘增强。

环境适应性:

真空封装设计,内部气压<1e-5 mbar,减少空气折射率波动影响。

钛合金框架与碳纤维复合散热片,热膨胀系数(CTE)匹配光刻机基座(0.8ppm/℃)。

2.性能突破

动态响应能力:

支持3000线/秒的晶圆扫描速度,图像采集延迟<1ms。

抗干扰能力:

屏蔽层采用铜-银纳米复合材料,电磁屏蔽效能达90dB(1MHz~1GHz)。

能效优化:

动态功耗管理技术,待机功耗≤2W,运行功耗≤15W。

技术规格:ASML 4022 435 2439 40224352439

参数项规格描述

分辨率15360×8640像素

帧率180Hz(全分辨率模式)

量子效率≥90% 405nm

工作温度20℃±0.2℃(恒温控制)

真空环境内部气压<1e-5 mbar

接口类型Camera Link HS Gen3(带宽≥20Gbps)

功耗≤15W(运行模式)

核心价值与性能亮点

1.极端环境适应性

真空环境稳定性:采用无油润滑磁悬浮轴承,避免污染光学元件。

低温恒温设计:内置激光冷却模块,温度波动≤0.02℃,确保传感器暗电流<2e-5 A。

2.多场景扩展性

跨代兼容性:适配ASML NXE 3800E及后续High-NA EUV光刻机。

工业互联网集成:支持MQTT协议,可与光刻机控制系统实时同步检测数据。

3.全生命周期成本优化

自清洁功能:内置等离子体清洗系统,减少镜头维护频率。

模块化更换:传感器与激光光源组件可独立更换,维修成本降低60%。

Product brief description

ASML 4022 435 2439 40224352439 is a high-precision optical detection module designed by ASML for lithography machines.The core features include:

Nano-level resolution:CMOS global shutter sensor is used,with a single pixel size of≤0.5μm and a resolution of≥16K(15360×8640).

Real-time dynamic calibration:supports laser interferometer linkage calibration,with positioning error≤0.05μm.

Clean room-level protection:passed Class 1 clean room certification,airtightness level IP69K,antistatic level ESD 10kV.

Product details

1.Technical architecture and core functions

Optical imaging system:

The lens group uses free curved lenses and polarization spectroscopy technology to eliminate scattering interference from the laser light of the lithography machine.

Integrated tunable laser light source(wavelength 405nm/450nm/633nm)supports multispectral imaging mode.

Sensor and processing unit:

Global shutter CMOS sensor(Sony IMX519 series),quantum efficiency≥90%(405nm wavelength).

Independently developed FPGA chip(ASML-FPGA 2025),supporting real-time image noise reduction and edge enhancement.

Environmental adaptability:

Vacuum package design,internal air pressure<1e-5 mbar,reducing the influence of air refractive index fluctuations.

Titanium alloy frame and carbon fiber composite heat sink,thermal expansion coefficient(CTE)matches the base of the lithography machine(0.8ppm/℃).

2.Performance breakthrough

Dynamic response capability:

Supports wafer scanning speed of 3000 lines/second,and image acquisition delay is<1ms.

Anti-interference ability:

The shielding layer is made of copper-silver nanocomposite material,and the electromagnetic shielding effect is 90dB(1MHz~1GHz).

Energy efficiency optimization:

Dynamic power consumption management technology,standby power consumption≤2W,and operating power consumption≤15W.

Technical specifications:ASML 4022 435 2439 40224352439

Parameters Specification Description

Resolution 15360×8640 pixels

Frame rate 180Hz(full resolution mode)

Quantum efficiency≥90% 405nm

Working temperature:20℃±0.2℃(constant temperature control)

Vacuum environment Internal air pressure<1e-5 mbar

Interface type Camera Link HS Gen3(bandwidth≥20Gbps)

Power consumption≤15W(operating mode)

Core Values​​and Performance Highlights

1.Extreme environmental adaptability

Vacuum environment stability:oil-free lubricated magnetic levitation bearings are used to avoid contamination of optical components.

Low temperature constant temperature design:built-in laser cooling module,temperature fluctuations≤0.02℃,ensuring the sensor dark current<2e-5 A.

2.Multi-scene scalability

Cross-generation compatibility:adapted to ASML NXE 3800E and subsequent High-NA EUV lithography machines.

Industrial Internet integration:supports MQTT protocol and can detect data in real time synchronously with the lithography machine control system.

3.Full life cycle cost optimization

Self-cleaning function:built-in plasma cleaning system to reduce lens maintenance frequency.

Modular replacement:The sensor and laser light source components can be replaced independently,reducing maintenance costs by 60%.