LAM 685-069171-100 LAM

LAM 685-069171-100的命名结构符合Lam Research(全球领先半导体设备制造商)的部件编码规则,为以下类型之一:

气体分配盘(Gas Distribution Plate,GDP):用于化学气相沉积(CVD)或蚀刻设备,均匀分配工艺气体至晶圆表面。

射频(RF)匹配器组件:如匹配网络中的电容、电感模块,用于调节等离子体生成功率。

真空腔室部件:如聚焦环(Focus Ring)、屏蔽环(Shield Ring),保护腔室内壁并优化等离子体分布。

传感器或执行器:如压力传感器、质量流量控制器(MFC)的替换模块。

2.1若为气体分配盘(GDP)

参数项可能规格

适用设备Lam Research Kiyo™或Vector™系列蚀刻机(用于28nm/14nm/7nm工艺节点)

材质铝合金(阳极氧化)或316L不锈钢(耐等离子体腐蚀,表面粗糙度Ra≤0.1μm)

气体通道多孔结构(如100~500个微孔),孔径0.1~0.5mm(确保气体均匀性±2%)

温度范围-50℃~+200℃(支持低温蚀刻或高温沉积工艺)

兼容性符合SEMI标准接口(如VCR®或Swagelok®接头,泄漏率<1×10⁻⁹mbar·L/s)

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描述

1.产品定位与分类推测

LAM 685-069171-100的命名结构符合Lam Research(全球领先半导体设备制造商)的部件编码规则,为以下类型之一:

气体分配盘(Gas Distribution Plate,GDP):用于化学气相沉积(CVD)或蚀刻设备,均匀分配工艺气体至晶圆表面。

射频(RF)匹配器组件:如匹配网络中的电容、电感模块,用于调节等离子体生成功率。

真空腔室部件:如聚焦环(Focus Ring)、屏蔽环(Shield Ring),保护腔室内壁并优化等离子体分布。

传感器或执行器:如压力传感器、质量流量控制器(MFC)的替换模块。

2.1若为气体分配盘(GDP)

参数项可能规格

适用设备Lam Research Kiyo™或Vector™系列蚀刻机(用于28nm/14nm/7nm工艺节点)

材质铝合金(阳极氧化)或316L不锈钢(耐等离子体腐蚀,表面粗糙度Ra≤0.1μm)

气体通道多孔结构(如100~500个微孔),孔径0.1~0.5mm(确保气体均匀性±2%)

温度范围-50℃~+200℃(支持低温蚀刻或高温沉积工艺)

兼容性符合SEMI标准接口(如VCR®或Swagelok®接头,泄漏率<1×10⁻⁹mbar·L/s)

2.2若为射频匹配器组件

参数项可能规格

频率范围2~100 MHz(覆盖等离子体生成常用频段)

功率容量1~5 kW(支持高密度等离子体蚀刻)

匹配精度VSWR≤1.5:1(电压驻波比,确保功率高效传输)

冷却方式水冷或风冷(温度控制精度±1℃,防止热漂移)

接口类型N型或2.92mm射频连接器(低损耗,适用于高频信号传输)

1.Product Positioning and Classification

The naming structure of the LAM 685-069171-100 conforms to the part numbering conventions of Lam Research(a leading global semiconductor equipment manufacturer)and is one of the following types:

Gas Distribution Plate(GDP):Used in chemical vapor deposition(CVD)or etching equipment to evenly distribute process gases across the wafer surface.

RF Matching Components:Such as capacitor and inductor modules in matching networks,used to regulate plasma power.

Vacuum Chamber Components:Such as focus rings and shield rings,which protect the chamber walls and optimize plasma distribution.

Sensors or Actuators:Such as pressure sensors and replacement modules for mass flow controllers(MFCs).2.1 Gas Distribution Plate(GDP)

Parameters:Possible Specifications

Applicable Equipment:Lam Research Kiyo™or Vector™series etchers(for 28nm/14nm/7nm process nodes)

Material:Aluminum alloy(anodized)or 316L stainless steel(plasma-resistant,surface roughness Ra≤0.1μm)

Gas Channels:Multi-porous structure(e.g.,100–500 micropores),pore diameter 0.1–0.5mm(ensure gas uniformity±2%)

Temperature Range:-50°C–+200°C(supports low-temperature etching or high-temperature deposition processes)

Compatibility:SEMI-standard interfaces(e.g.,VCR®or Swagelok®connectors,leak rate<1×10⁻⁹mbar·L/s)

2.2 RF Matching Components

Parameters:Possible Specifications

Frequency Range:2–100 MHz(covers the common frequency band for plasma generation)

Power Capacity:1–5 kW(supports High-density plasma etching)

Matching accuracy:VSWR≤1.5:1(voltage standing wave ratio,ensuring efficient power transmission)

Cooling:Water or air cooling(temperature control accuracy±1°C to prevent thermal drift)

Interface:N-type or 2.92mm RF connector(low loss,suitable for high-frequency signal transmission)

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