描述
产品定位与功能
NI PXI-4130是美国国家仪器（NI）推出的高精度源测量单元（SMU），专为半导体测试、材料研究及微弱信号检测场景设计。其核心功能包括四象限电压/电流源表、皮安级电流测量及动态I-V特性曲线扫描，支持自动化测试系统中高灵敏度电气参数分析。
核心参数与性能
源表输出能力
-电压范围：±20 V（可扩展至±40 V通过外部放大器）；
-电流范围：±20 mA（源/阱模式）；
-功率容量：±400 mW（连续模式）。
测量精度
-电压测量：分辨率12μV，准确度±（0.01%+0.01 mV）；
-电流测量：分辨率10 pA（低噪声模式），准确度±（0.05%+0.5 pA）。
动态响应
-最大扫描速率：10 kHz（脉冲模式）；
-噪声性能：电压噪声<0.1μV RMS（1 Hz–100 kHz带宽）。
接口与扩展
-连接器类型：BNC（高密度接线端子阵列）；
-同步支持：通过PXI Star Trigger实现多SMU时序同步。
技术特点
四象限操作
-支持电压/电流源与阱模式自由切换，适用于电化学阻抗谱分析等双向能量流动场景。
低电平测量优化
-输入保护：内置100 V浪涌保护电路；
-屏蔽设计：全金属屏蔽罩降低环境电磁干扰（EMI）。
软件集成
-驱动兼容：NI-DCPower与NI-SWITCH Executive软件，支持LabVIEW、Python脚本编程；
-序列生成：内置FPGA实现复杂I-V曲线自动生成（如半导体器件特性测试）。
典型应用场景
半导体器件验证
-MOSFET导通电阻测量（四象限动态扫描）；
-二极管反向漏电流特性分析（皮安级灵敏度）。
新能源材料研究
-太阳能电池IV曲线测试（宽电压范围覆盖）；
-电池内阻快速测量（脉冲模式降低极化效应）。
生物传感器开发
-离子通道电流检测（低噪声电路设计适配）；
-微流控系统电极控制（高密度多路输出）。
Product Positioning and Functions
NI PXI-4130 is a high-precision source measurement unit(SMU)launched by National Instruments(NI),designed for semiconductor testing,material research and weak signal detection scenarios.Its core functions include four-quadrant voltage/current source meter,pico-Axis current measurement and dynamic I-V characteristic curve scanning,supporting high-sensitivity electrical parameter analysis in automated testing systems.
Core parameters and performance
Source table output capability
-Voltage range:±20 V(scalable to±40 V through external amplifier);
-Current range:±20 mA(source/well mode);
-Power capacity:±400 mW(continuous mode).
Measurement accuracy
-Voltage measurement:resolution 12μV,accuracy±(0.01%+0.01 mV);
-Current measurement:resolution 10 pA(low noise mode),accuracy±(0.05%+0.5 pA).
Dynamic response
-Maximum scan rate:10 kHz(pulse mode);
-Noise performance:Voltage noise<0.1μV RMS(1 Hz–100 kHz bandwidth).
Interfaces and extensions
-Connector type:BNC(high density terminal array);
-Synchronization support:Multi-SMU timing synchronization is achieved through PXI Star Trigger.
Technical Features
Four Quadrant Operation
-Supports free switching of voltage/current source and well modes,suitable for bidirectional energy flow scenarios such as electrochemical impedance spectrum analysis.
Low level measurement optimization
-Input protection:built-in 100 V surge protection circuit;
-Shielding design:All-metal shielding cover reduces environmental electromagnetic interference(EMI).
Software Integration
-Driver compatibility:NI-DCPower and NI-SWITCH Executive software,supporting LabVIEW and Python script programming;
-Sequence generation:Built-in FPGA realizes automatic generation of complex I-V curves(such as semiconductor device characteristic testing).
Typical application scenarios
Semiconductor device verification
-MOSFET on-resistance measurement(four quadrant dynamic scan);
-Analysis of diode reverse leakage current characteristics(pico-axis sensitivity).
Research on new energy materials
-Solar cell IV curve test(wide voltage range coverage);
-Quick measurement of internal resistance of the battery(pulse mode reduces polarization effect).
Biosensor development
-Ion channel current detection(low noise circuit design adaptation);
-Microfluidic system electrode control(high density multi-output).
