ni_tbx_1328_b8299d_

-振动耐受:符合MIL-STD-810G标准(军用级测试场景适用);

-温度范围:-40°C至+85°C(宽温设计)。

技术特点

模块化设计

-热插拔支持:允许带电更换故障通道模块;

-冗余配置:双控制器架构(主备切换时间<50 ms)。

软件集成

-驱动兼容:NI-TestStand与LabVIEW状态监测库;

-诊断功能:内置自检算法(通道导通性/绝缘性测试)。

安全防护

-过压保护:±40 V钳位电路(数字信号通道);

描述

产品定位与功能

NI TBX 1328 B8299D推测为PXI/PXI Express系统配套的高密度测试接入模块,主要用于多通道信号路由与接口扩展,适用于复杂测试系统中信号的灵活分配与管理。其核心功能可能包括:

信号切换:支持射频/数字信号的自动切换(如开关矩阵功能);

接口适配:提供SMA、BNC、MCX等混合接头形式;

环境隔离:通过光隔离或电磁屏蔽降低信号干扰。

核心参数与性能(推测)

物理接口配置

-通道数:16/32通道(可扩展);

-频率范围:DC–6 GHz(射频通道);

-功率容量:≤2 W(连续波输入)。

控制与同步

-通信协议:PXI Star Trigger及Local Bus控制;

-切换速度:≤1 ms(机械继电器型)或≤100 ns(固态继电器型)。

环境适应性

-振动耐受:符合MIL-STD-810G标准(军用级测试场景适用);

-温度范围:-40°C至+85°C(宽温设计)。

技术特点

模块化设计

-热插拔支持:允许带电更换故障通道模块;

-冗余配置:双控制器架构(主备切换时间<50 ms)。

软件集成

-驱动兼容:NI-TestStand与LabVIEW状态监测库;

-诊断功能:内置自检算法(通道导通性/绝缘性测试)。

安全防护

-过压保护:±40 V钳位电路(数字信号通道);

-电磁兼容:通过CISPR 22 Class A认证。

Product Positioning and Functions

NI TBX 1328 B8299D is speculated to be a high-density test access module that supports PXI/PXI Express systems.It is mainly used for multi-channel signal routing and interface expansion,and is suitable for flexible distribution and management of signals in complex test systems.Its core functions may include:

Signal switching:supports automatic switching of RF/digital signals(such as switch matrix function);

Interface adaptation:Provides mixed connector forms such as SMA,BNC,MCX;

Environmental isolation:Reduce signal interference through optical isolation or electromagnetic shielding.

Core parameters and performance(speculation)

Physical interface configuration

-Number of channels:16/32 channels(scalable);

-Frequency range:DC–6 GHz(RF channel);

-Power capacity:≤2 W(continuous wave input).

Control and synchronization

-Communication protocol:PXI Star Trigger and Local Bus control;

-Switching speed:≤1 ms(mechanical relay type)or≤100 ns(solid-state relay type).

Environmental adaptability

-Vibration resistance:complies with MIL-STD-810G standard(applicable for military-grade testing scenarios);

-Temperature range:-40°C to+85°C(wide temperature design).

Technical Features

Modular design

-Hot-swap support:allows for live replacement of fault channel modules;

-Redundant configuration:Dual controller architecture(main-stop switching time<50 ms).

Software Integration

-Driver compatibility:NI-TestStand and LabVIEW status monitoring library;

-Diagnostic function:built-in self-test algorithm(channel conductivity/insulation test).

Safety protection

-Overvoltage protection:±40 V clamp circuit(digital signal channel);

-Electromagnetic compatibility:CISPR 22 Class A certified.