描述
产品概述
PXIe-6674T是美国国家仪器（NI）推出的高性能PXI Express时钟与同步模块，专为多设备高精度同步、复杂触发场景设计。其集成板载精密控温晶体振荡器（OCXO）与直接数字合成（DDS）技术，支持跨机箱信号路由，适用于高通道数测量系统（如半导体测试、航空航天设备监测）。
核心功能与特性
时钟生成与同步
-高精度参考源：
-板载OCXO（精度80 ppb），输出稳定10 MHz时钟；
-DDS电路生成0.3 Hz至1 GHz可编程时钟（分辨率2.84µHz）；
-信号路由：
-支持CLKIN/CLKOUT配置，可连接外部时钟或PXI_CLK10_IN；
-差分LVDS触发总线（PXIe_DSTARA/B/C）及8条PXI触发线。
接口与扩展性
-前端连接器：
-6个SMA接口（PFI 0-5），支持单端LVTTL或LVDS差分模式；
-3对PFI_LVDS（可编程输入/输出，不兼容同时双向传输）；
-多机箱同步：
-通过PXIe_DSTARA/B/C实现跨PXI/PXI Express机箱信号互联。
兼容性与安装要求
-机箱适配：
-需安装于PXI Express机箱的系统时钟槽（部分机箱支持其他插槽，但部分功能受限）；
-兼容PXI与PXI Express混合系统；
-驱动支持：
-最低支持NI-Sync 3.4.1驱动，推荐使用最新版本。
技术参数
|参数类别|详细规格|
|时钟性能|DDS频率范围：0.3 Hz–1 GHz；OCXO稳定性：±80 ppb|
|触发线路|8条双向PXI触发线+13组差分PXIe_DSTAR触发对|
|物理接口|6×SMA单端/LVDS可配置接口+3×LVDS差分对|
|功耗与散热|典型功耗<15 W（需参考机箱散热设计）|
典型应用场景
高密度数据采集：
-协调多块PXIe-6363动态信号采集卡同步采样（如振动台多点监测）；
分布式测试系统：
-跨机箱同步PXIe-6674T与第三方仪器（如示波器、逻辑分析仪）；
精密触发控制：
-实现半导体测试中的多阶段触发序列（如电源启动与信号捕获联动）。
Product Overview
The PXIe-6674T is a high-performance PXI Express clock and synchronization module launched by National Instruments(NI),designed for high-precision synchronization and complex trigger scenarios for multiple devices.It integrates on-board precision temperature-controlled crystal oscillator(OCXO)and direct digital synthesis(DDS)technology,supports cross-chassis signal routing,and is suitable for high-channel number measurement systems(such as semiconductor testing,aerospace equipment monitoring).
Core functions and features
Clock generation and synchronization
-High-precision reference source:
-Onboard OCXO(precision 80 ppb),stable output of 10 MHz clock;
-DDS circuit generates a programmable clock from 0.3 Hz to 1 GHz(resolution 2.84µHz);
-Signal routing:
-Supports CLKIN/CLKOUT configuration,can be connected to external clock or PXI_CLK10_IN;
-Differential LVDS trigger bus(PXIe_DSTARA/B/C)and 8 PXI trigger lines.
Interface and Extensibility
-Front-end connector:
-6 SMA interfaces(PFI 0-5),supporting single-ended LVTTL or LVDS differential mode;
-3 pairs of PFI_LVDS(programmable input/output,incompatible with simultaneous bidirectional transmission);
-Multi-chassis synchronization:
-Achieves cross-PXI/PXI Express chassis signal interconnection through PXIe_DSTARA/B/C.
Compatibility and installation requirements
-Chassis adaptation:
-The system clock slot that needs to be installed in the PXI Express chassis(some chassis supports other slots,but some functions are limited);
-Compatible with PXI and PXI Express hybrid systems;
-Driver support:
-The minimum support for NI-Sync 3.4.1 driver is recommended.The latest version is recommended.
Technical parameters
|Parameter category|Detailed specifications|
|Clock performance|DDS frequency range:0.3 Hz–1 GHz;OCXO stability:±80 ppb|
|Trigger line|8 bidirectional PXI trigger lines+13 differential PXIe_DSTAR trigger pairs|
|Physical Interface|6×SMA Single-ended/LVDS Configurable Interface+3×LVDS Differential Pair|
|Power and heat dissipation|Typical power dissipation<15 W(refer to the chassis heat dissipation design)|
Typical application scenarios
High-density data acquisition:
-Coordinate the synchronous sampling of multiple PXIe-6363 dynamic signal acquisition cards(such as multi-point monitoring of the vibration table);
Distributed testing system:
-Synchronize PXIe-6674T with third-party instruments(such as oscilloscopes,logic analyzers)across chassis;
Precision trigger control:
-Implement multi-stage trigger sequences in semiconductor testing(such as linkage of power start and signal capture).
